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The Atom Probe that enables routine 3D nano-analysis for both research and industry.

Building on 30 years of success in Atom Probe Tomography instrumentation and application, CAMECA announces EIKOS™, the Atom Probe microscope that enables routine, high performance 3D nano-analysis for both research and industry.

stainless-steel-analysis-with-eikos-apt CAMECA's new solution to rapid alloy development and nanoscale materials research

EIKOS provides accessibility to Atom Probe Tomography with a low cost of ownership and ease-of-use. Utilizing standard microscopy sample preparation methods, it delivers nanoscale structural information enabling faster development of alloys for industrial use and a deep understanding of materials for research applications.
EIKOS addresses a wide range of APT applications that have been demonstrated for over 30 years. The base EIKOS model with voltage pulsing enables a variety of metallurigal applications. The full EIKOS configuration expands the applications space into semiconductor, thin films and coatings.

Key features of the EIKOS platform

  • Three-dimensional tomography with nanoscale characterization of microstructures
  • High spatial resolution single atom detection with high efficiency
  • Equal sensitivity to all elements and their isotopes
  • Quantitative composition measurement (sub-nm to near micron scale)
  • Available in voltage or voltage & laser configurations
  • Standard specimen preparation methods

EIKOS is available in 2 configurations:


The base EIKOS system incorporates a reflectron design to provide excellent mass resolving power and signal to noise. A pre-aligned integrated counter electrode ensures ease of use and high reliability. The voltage pulsing system provides very high data quality on a wide variety of metallurgical applications. 


The fully configured EIKOS-X system combines all the outstanding features of the base EIKOS (voltage pulsed, reflectron based functionality, prealigned counter electrode) and adds a fully integrated laser pulsing module with computer controlled focused spot design to provide access to a larger application range.

The base EIKOS system is field upgradable to the EIKOS-X. Ask your sales representative for details.




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