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SXFive

Electron Probe Micro Analyzer for Materials & Geosciences

Combining advanced electron optics, state-of-the-art spectrometer design and dedicated software, the CAMECA SXFive performs high accuracy qualitative and quantitative chemical microanalysis in geochemistry, mineralogy, geochronology, physical and nuclear metallurgy, material sciences (including cements, glass, ceramics …), biochemistry, microelectronics…

Optimized electron column

The SXFive comes equipped with a versatile electron gun compatible with W and LaB6. The beam current is continuously regulated, achieving a stability of 0.3% per 12 hours, thus enabling reliable long term quantitative analyses. The beam intensity is accurately measured thanks to an annular Faraday cup and electrostatic deflection. The high voltage system operates at up to 30 kV for elements with high atomic number. High intensity beam currents (several µA) may be used for trace element measurements and high speed X-ray mapping.
The SXFive can be upgraded with a Field Emission source (see SXFiveFE model).

The finest Wavelength Dispersive Spectrometers (WDS)

Quantitative x-ray mapping in carburized steelWavelength Dispersive Spectrometry is acknowledged as the method of choice for high precision quantitative analysis. Up to 5 WDS spectrometers, plus one energy dispersive spectrometer EDS, may be fitted to the SXFive microprobe. Optical encoders ensure the accurate positioning of the spectrometers which can be mounted vertically for flat and polished specimens or may be inclined for rough specimens. High sensitivity crystals allow a nearly 3-fold increase in count rate while maintaining peak to background ratio and spectral resolution, and keeping the full spectrometer analysis range.
Right side example shows optimized Ca, Fe and Mg mapping with the CAMECA high intensity crystals.

Fully integrated optical microscope

Using a CCD digital camera, opaque specimens are viewed in reflected light while thin sections are imaged in transmitted light. The Field Of View of the optical image is continuously variable from 250 to 1700 µm thanks to a motorized lens. An autofocus system guarantees that the specimen surface returns to the correctly focused position at any time.

Dedicated automation and analysis software package

The SXFive is equipped with modern X-ray imaging acquisition technologies, PC automation under the latest Windows version, and a user-friendly interface. All analytical processes are fully automated for maximum efficiency. You may request our PeakSight brochure for full details on this dedicated software package.


CAMECA SXFive
EPMA

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