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Path: Home>Service & Support>NanoSIMS Upgrade Kits
Upgrade Kits for the CAMECA NanoSIMS 50 / 50L

PRIMARY COLUMN

D1 5-Slits_NS: Five D1 Aperture Diaphragm Slit
Objective/immersion lens aperture strip increases the flexibility by increasing the diameter choice from 4 to 5 sizes.

EXLIE Pre-implant_NS: Extreme low impact energy
Ultra Low energy (25-500eV) sample bombardment allows Pre-implantation/cleaning without consuming top surface of ultrathin samples.

High Current Column_NS: High current primary ion column
Allows Larger maximum Cs+ beam current (up to 20nA instead of a few nA)
Using larger current permits to use multiple FCs instead of EM and improve isotope ratio reproducibility.

MASS ANALYZER

 
EM Preamplifier Gen2_NS: Five new EM preamplifier-discriminators
Improvement of electronic ion pulse amplification for ion counting.
More reliable settings and adjustments of discriminator/threshold for more reproducible isotopic ratios.

Internal Multico Gen2_NS: New internal Multicollection
Improved reliability, less short-circuits and blockages due to moveable cables.

Low Noise Preamplifier_NS: Multico Geo Faraday : low noise preamplifier for FC#1
Precise FC-EM isotope ratios
Lower noise/background for the Faraday cup resulting in better reproducibility and larger current detection range in FC.

Multico Triple Faraday_NS: Multicollection triple Faraday
Three FCs instead of one
Permits to measure isotopic ratios in multiple FCs with sub-permil reproducibility, generally recorded with higher (a few nA) and µm spot.

NMR H/D_NS: Additional NMR probe for Hydrogen
Stability of low mass spectrum lines.
A third, dedicated NMR probe is added and improves the stability of analyzer magnetic field for high reproducibility on H ratios.

IMAGING

Optical Microscope Gen2_NS: Improved Optical Microscope
Replacement of illumination and optical microscope for more uniform lighting, digital camera, better resolution, numerical zoom

SED_NS: Secondary Electron Detector
Secondary electron imaging for localization of small particles and good contrast to complement SIMS imaging.

ELECTRONICS

32b_Acquisition Board_NS: 32 bits counting board
Replaces 16bit former version and is necessary for remote control through the internet using Team Viewer. No more saturation on SIMS images, faster scanning for less charging problems.

DATA SYSTEM

 
PC automation_NS: PC Windows Control Upgrade
The SUN system is no more supported and replaced by a PC Windows 7 automation.
New functions available under PC version.

Software Version Update_NS: Updated Software version
Latest PC automation version for removal of problems, new functions, and also required for some upgrades.

Control Duplication_NS: Duplication of NanoSIMS control
Control of the instrument from a separate operator room (<50 m), Cameca designed keypad on both rooms. Allows Optimized operation comfort (reduced noise, separate T°C control)

Additional Standard WinImage_NS: Additional Standard WinImage Off-line PC Software Licence
Image processing of SUN and PC data. Dongle for Multiple users.

AUTOMATION

DUO Auto Valve_NS: Automation of Duoplasmatron leak valve
Allows closing the leak valve at the end of unattended acquisition when using the duoplasmatron for longer use of duo source between dismounting for cleaning.

Full MDA_NS: Aperture and Hexapole Automation
Automation of slits & apertures for improvement of reproducibility, access by lower level users, chaining of cleaning/acquisition, comfort of use.

EM-FC Switch_NS: Automated in-situ EM-FC Switch
Designed to improve uptime and stability of the instrument and offer higher flexibility.

SAMPLE-HOLDERS AND SHUTTLES

SAMPLE-HOLDERS & SHUTTLES_NS: List of the sample-holders and the shuttles available here
Please contact the after-sales service for orders.

You may also check the latest software version available for your instrument.

Don't hesitate to contact your local agent or the CAMECA sales department for more information.


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